We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Analyzing Crystal.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Analyzing Crystal - List of Manufacturers, Suppliers, Companies and Products

Analyzing Crystal Product List

1～2 item / All 2 items

Displayed results
X-ray spectroscopic crystal for spectral analysis

X-ray spectroscopic crystal for spectral analysis

Powerful qualitative/quantitative analysis methods! Supply of various spectral crystals.

We would like to introduce the "X-ray Spectroscopic Crystals" that we handle. The spectral analysis of X-rays emitted from the sample after irradiation is a powerful qualitative and quantitative analytical method. Curved plates are provided with custom holders and are compatible with both Johann and Johansson types. 【Features】 ■ Supply of various crystals - LiF, quartz or SiO2, InSb, Si, Ge, PET, ADP, beryl, TlAP, RbAP, KAP, and CsAP ■ Flat plates ■ Curved plates - Provided with custom holders, compatible with both Johann and Johansson types * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Spectroscopic Analysis Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Seven spectral crystals in EPMA analysis

Seven spectral crystals in EPMA analysis

Introduction to the measurement principle of wavelength dispersive X-ray spectrometers (WDS) and examples of measurements for 22Ti!

EPMA has seven spectroscopic crystals, and by selecting a spectrometer that matches the wavelength of the target element, it achieves good energy resolution and detection sensitivity, allowing for excellent results in quantitative analysis of trace components and map analysis. This document provides detailed information on the "measurement principle of wavelength dispersive X-ray spectrometers (WDS)" and includes examples such as "measurement example of 22Ti" with illustrations. Please take a moment to read it. [Contents] ■ Wavelength Dispersive X-ray Spectrometer (WDS) ■ Measurement Example: 22Ti *For more details, please refer to the PDF document or feel free to contact us.

  • Spectral_crystal_range.png
  • Other contract services

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.